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WELCOME TO IEEM 2008
The
International Conference on Industrial Engineering and Engineering
Management (IEEM) aims to provide a forum to disseminate, to all branches
of industries, information on the most recent and relevant
research,
theories and practices in IEEM. This conference has been hosted by
leading universities in Asia and has grown over the years in tandem
with the rising importance of industrial engineering and
applications.
Following the success of our IEEM2007 held in
Singapore last year, the IEEE Engineering Management
Society Singapore Chapter is organizing this conference again.
We hope that IEEM2008
will link researchers and practitioners from different branches of
industrial engineering and engineering management from around
the world. Our chapter successfully organized several IEEE
conferences in the past. Built on the experience of those
conferences, IEEM2008 will be a conference of very high standard.
Please consider attending it and submit your paper before 1 June
2008.
Download Call for Papers in PDF
CALL FOR PAPER
Authors are invited to submit to paper for
following topics.
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Decision Analysis and Methods
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E-Business and E-Commerce
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Engineering Economy and Cost Analysis
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Engineering Education and Training
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Facilities Planning and Management
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Global
Manufacturing and Management
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Human
Factors
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Information Processing and Engineering
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Intelligent Systems
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Manufacturing Systems
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Operations Research
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Production Planning and Control
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Project Management
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Quality Control and Management
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Reliability and Maintenance Engineering
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Safety, Security and Risk Management
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Service Innovation and Management
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Supply
Chain Management
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Systems Modeling and Simulation
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Technology and Knowledge Management
Submission online
PUBLICATION
All submissions will be peer reviewed. Accepted
papers will be published in the conference proceedings, which will
appear in the IEEEXplore database and indexed by Engineering Index (EI).
Extended papers may be considered for special issues of selected
international journals, subject to further review.
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